Scanning Electron Microscope
Oryginalny tytuł ogłoszenia
Sweden – Scanning electron microscopes – SEM
Ocena szansy
Skąd ta ocena?
Szansa
50 / 100
Złożoność
50 / 100
Czynniki ryzyka
Award and selection criteria are not specified in available data. Bidders cannot assess how the tender will be evaluate...
Two lots with identical descriptions and values suggest data duplication. It is unclear if the tender is for one or two...
Głęboka analiza portfolio
Wykorzystuje:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications
Przegląd
Moderate opportunityKluczowe fakty
- SEK 7M estimated value
- Supplies contract
- 2 lots
- Supply and delivery of a scanning electron microscope (SEM)
- Energy dispersive X-ray (EDX) detector
Pokaż pełne podsumowanie
Tender by Chalmers University of Technology for a high-end scanning electron microscope (SEM) with EDX and EBSD detectors. Estimated value 7,000,000 SEK. Open procedure, electronic submission required. Deadline 27 July 2026. Two lots identified but with identical descriptions and values, likely indicating a single procurement. No award criteria or eligibility criteria provided. Inconsistency in EU funding status (structured data indicates EU-funded, XML notice indicates no EU funds).
Ryzyka
Award and selection criteria are not specified in available data. Bidders cannot assess how the tender will be evaluate...
Two lots with identical descriptions and values suggest data duplication. It is unclear if the tender is for one or two...
Analiza może być niepełna
Przeanalizowano tylko część dokumentacji. Pozostałe dokumenty mogą zawierać dodatkowe wymagania, certyfikaty lub dokumenty do złożenia.
Kluczowe wymagania
Technical
- High-end, user-friendly, and versatile SEM
- State-of-the-art EDX and EBSD detectors
- Ability to image dry samples regardless of conductivity, magnetic properties, or geometry
Wymagania mogą być niepełne.
Zamawiający
Lokalizacja
GÖTEBORG, SWE
Strona
Identyfikator
5564795598
Działalność
Education
Części (2)
LOT-0001
General requirements
Procurement of a high-end SEM with EDX and EBSD detectors for high-resolution imaging of dry samples.
EUR 634.5k
Szacowana wartość
Kategoria
Termin
Szczegóły kryteriów
Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.
Dodatkowe kody CPV
Uwaga do wartości
Pokaż oryginalne dane TED
Oryginalny opis TED
Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.
LOT-0002
Tenderer's suitability
Same scope as LOT-0001; appears to be a duplicate or mislabeled lot.
EUR 634.5k
Szacowana wartość
Kategoria
Termin
Szczegóły kryteriów
Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.
Dodatkowe kody CPV
Uwaga do wartości
Pokaż oryginalne dane TED
Oryginalny opis TED
Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.
Szczegóły zamówienia
- Data publikacji
- 05 Jul 2026
- Języki
- English, Swedish
Metadane referencyjne
- Podstawa prawna
- 32014L0024
Identyfikatory referencyjne
- ID przetargu
- 461781-2026
Dokumenty (2)
Podobne przetargi
Sweden – Scanning electron microscopes – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
France – Scanning electron microscopes – Microscope électronique à balayage équipé d’un spectromètre EDS et d’accessoires spécifiques
Switzerland – Scanning electron microscopes – MEBMHN_A1 / Acquisition d'un microscope électronique à balayage
Ocena szansy
Skąd ta ocena?
Szansa
50 / 100
Złożoność
50 / 100
Czynniki ryzyka
Award and selection criteria are not specified in available data. Bidders cannot assess how the tender will be evaluate...
Two lots with identical descriptions and values suggest data duplication. It is unclear if the tender is for one or two...
Głęboka analiza portfolio
Wykorzystuje:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications