Germany – Microscopes – Digitalmikroskopie- und Analyseplattform

Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | IMWS vertreten durch: Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWSHalle (Saale), GermanyNot disclosed23 days leftopen

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Opportunity Score

Confidence: 60%

Complexity: medium

23 days

Deadline

supplies

Contract

SME suitable

Deep Portfolio Analysis

Company fit score
Missing certificates
Eligibility blockers
Bid / No-Bid recommendation

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AI Analysis Summary

Moderate opportunity

Open tender by Fraunhofer IMWS for a modular digital microscopy and analysis platform with three workstations for research in electronics and optics. Performance in Halle (Saale), Germany. Single lot, open procedure, supplies. No estimated value provided. Deadline 2026-07-10 (30 days from publication). Award based on price (60%), delivery time (30%), and sustainability (10%). Eligibility requires annual turnover and references. Submission electronic only, in German. Suitable for SMEs.

Strengths

Documents available

Open procedure

Medium complexity

Analysis may be incomplete

Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.

Key Requirements

Modular design with three workstations
Broad application range: large-area overview to high-resolution microanalysis
Compatibility with different materials, surfaces, sample sizes, and geometries

Buyer

Name

Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | IMWS vertreten durch: Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS

Location

Halle (Saale), DEU

[email protected]

Identifier

993-03005FHG-85

Lots (1)

#LOT-0000Digitalmikroskopie- und Analyseplattform

Supply of a modular digital microscopy and analysis system consisting of three workstations (two base systems and one interchangeable) for Fraunhofer IMWS in Halle (Saale). System must support macro to high-resolution microscopy, multiple illumination/observation modes, and software-controlled workflows for quantitative material analysis.

38510000DEU