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Acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure

Université de Technologie de Compiègne·Compiegne, France·EUR 0·Expired · Jul 10, 2026·Open·Supplies
Structured notice only
Titre original de l'avis

France – Scanning electron microscopes – Acquisition d'un microscope électronique à balayage, field emission gun (MEB FEG), à pression variable pour l'université de technologie de Compiègne

50/100

Score d'opportunité

Needs reviewMedium complexity
SuppliesExpired
Pourquoi ce score ?

Opportunité

50 / 100

Complexité

60 / 100

Facteurs de risque

No estimated value is given (0 EUR placeholder). Bidders cannot assess if budget is sufficient or anticipate competitio...

Discrepancy between structured data deadline (2026-07-10 10:00) and XML notice (2026-07-10 12:00). May cause late submi...

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Informations clés

Pouvoir adjudicateur
Université de Technologie de Compiègne
Pays
France
CPV
38511100 - Scanning electron microscopes
Date limite
Jul 10, 2026
Valeur estimée
EUR 0

Aperçu

Moderate opportunity

Faits clés

  • EUR 0 estimated value
  • Supplies contract
  • 1 lot
  • Duration 10 MONTH
  • Supply of one field emission gun scanning electron microscope (MEB FEG) with variable pressure capability
  • Delivery and installation at Université de Technologie de Compiègne, Compiègne, France
Afficher le résumé complet

This tender, issued by Université de Technologie de Compiègne (UTC), concerns the acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure capability, for delivery in Compiègne, France. The contract is for supplies, EU-funded, and follows an open procedure. The deadline for submission is 2026-07-10, with a time discrepancy (10:00 UTC vs 12:00 CET) that needs clarification. The estimated value is reported as 0 EUR, likely a placeholder. Award criteria are 70% technical quality (with sub-criteria), 20% price, and 10% after-sales service quality. Selection criteria are not specified. Procurement documents are available online but were not analyzed.

Risques

No estimated value is given (0 EUR placeholder). Bidders cannot assess if budget is sufficient or anticipate competitio...

Discrepancy between structured data deadline (2026-07-10 10:00) and XML notice (2026-07-10 12:00). May cause late submi...

L'analyse peut être incomplète

Seule une partie des documents de consultation a été analysée. Des exigences, certificats ou documents de soumission supplémentaires peuvent exister dans les documents restants.

Exigences clés

Technical

  • EU funding requires compliance with EU procurement rules

Administrative

  • Open procedure: any interested party may submit a tender
  • Electronic submission via achatpublic.com is required

Les exigences peuvent être incomplètes.

Critères d'attribution

Lot 1

Technical value 70% (sample analysis, features, software) — 70%Price 20% — 20%After-sales service 10% (warranty, support, spare parts) — 10%

Acheteur

Localisation

Compiegne, FRA

Profil acheteur

Ouvrir le profil

Identifiant

19601223100169

Activité

Education

Lots (1)

LOT-0001

Acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure

Supply and delivery of one MEB FEG microscope, including associated software, warranty, and after-sales support. Duration 10 months. EU-funded.

SuppliesEU fundedElectronic submission

EUR 0

Valeur estimée

Localisation

Compiègne, France

Durée

10 MONTH

Catégorie

Scanning electron microscopes

Critères d'attribution

Price

Date limite

Expired Jul 10, 2026

Détails de la procédure

Date de publication
09 Jun 2026
Langues
French

Métadonnées de référence

Base juridique
32014L0024

Identifiants de référence

ID de l'appel d'offres
397687-2026

Documents (2)