Scanning Electron Microscope
Original notice title
Sweden – Scanning electron microscopes – SEM
Opportunity Score
Why this score?
Opportunity
50 / 100
Complexity
50 / 100
Risk factors
Award and selection criteria are not specified in available data. Bidders cannot assess how the tender will be evaluate...
Two lots with identical descriptions and values suggest data duplication. It is unclear if the tender is for one or two...
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications
Overview
Moderate opportunityKey Facts
- SEK 7M estimated value
- Supplies contract
- 2 lots
- Supply and delivery of a scanning electron microscope (SEM)
- Energy dispersive X-ray (EDX) detector
Show full summary
Tender by Chalmers University of Technology for a high-end scanning electron microscope (SEM) with EDX and EBSD detectors. Estimated value 7,000,000 SEK. Open procedure, electronic submission required. Deadline 27 July 2026. Two lots identified but with identical descriptions and values, likely indicating a single procurement. No award criteria or eligibility criteria provided. Inconsistency in EU funding status (structured data indicates EU-funded, XML notice indicates no EU funds).
Risks
Award and selection criteria are not specified in available data. Bidders cannot assess how the tender will be evaluate...
Two lots with identical descriptions and values suggest data duplication. It is unclear if the tender is for one or two...
Analysis may be incomplete
Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.
Key Requirements
Technical
- High-end, user-friendly, and versatile SEM
- State-of-the-art EDX and EBSD detectors
- Ability to image dry samples regardless of conductivity, magnetic properties, or geometry
Requirements may be incomplete.
Buyer
Location
GÖTEBORG, SWE
Website
Identifier
5564795598
Activity
Education
Lots (2)
LOT-0001
General requirements
Procurement of a high-end SEM with EDX and EBSD detectors for high-resolution imaging of dry samples.
EUR 634.5k
Estimated value
Category
Deadline
Award details
Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.
Additional CPV codes
Value note
Show original TED data
Original TED description
Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.
LOT-0002
Tenderer's suitability
Same scope as LOT-0001; appears to be a duplicate or mislabeled lot.
EUR 634.5k
Estimated value
Category
Deadline
Award details
Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.
Additional CPV codes
Value note
Show original TED data
Original TED description
Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.
Procurement Details
- Publication date
- 05 Jul 2026
- Languages
- English, Swedish
Reference metadata
- Legal basis
- 32014L0024
Reference IDs
- Tender ID
- 461781-2026
Documents (2)
Similar tenders
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Switzerland – Scanning electron microscopes – MEBMHN_A1 / Acquisition d'un microscope électronique à balayage
Opportunity Score
Why this score?
Opportunity
50 / 100
Complexity
50 / 100
Risk factors
Award and selection criteria are not specified in available data. Bidders cannot assess how the tender will be evaluate...
Two lots with identical descriptions and values suggest data duplication. It is unclear if the tender is for one or two...
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications