Supply of an optical inspection system compatible with 100, 150 and 200mm
Original notice title
France – Microelectronic machinery and apparatus – Fourniture d’un système d’inspection optique compatible en 100, 150 et 200mm
Opportunity Score
Why this score?
Opportunity
40 / 100
Complexity
50 / 100
Risk factors
No estimated value is provided; may affect go/no-go decision and resource allocation.
Procurement documents (technical specifications, full award criteria) were not analyzed; they may contain critical requ...
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
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- Market & Experience
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Overview
Moderate opportunityKey Facts
- Supplies contract
- 1 lot
- Duration 12 MONTH
- Supply and delivery of an optical inspection system for unstructured wafers (100, 150, 200 mm diameters) with advanced sensitivity.
- Inspection of substrates of various materials and thicknesses.
Show full summary
This tender from CEA LETI (France) seeks an optical inspection system for unstructured wafers of 100, 150, and 200 mm diameters, with advanced sensitivity, for research activities. The contract includes a compulsory option for an extra warranty year and optional options for a transformer and maintenance training. The procedure is negotiated with a call for competition, and the contract is EU-funded (FEDER). No estimated value is provided. The submission deadline is 2026-07-27 (with a minor inconsistency between structured data and XML notice). The tender documents are available online but were not analyzed in detail.
Risks
No estimated value is provided; may affect go/no-go decision and resource allocation.
Procurement documents (technical specifications, full award criteria) were not analyzed; they may contain critical requ...
Analysis may be incomplete
Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.
Key Requirements
Technical
- System must be compatible with 100 mm, 150 mm, and 200 mm wafer diameters.
- Advanced sensitivity required for unstructured wafers.
- Ability to inspect substrates of different materials and thicknesses.
Requirements may be incomplete.
Award Criteria
Lot 1
Buyer
Name
Location
Grenoble, FRA
Website
Buyer profile
Identifier
775 685 019 00298
Activity
Education
Lots (1)
LOT-0001
Supply of an optical inspection system compatible with 100, 150 and 200mm
Acquisition of an optical inspection system for unstructured wafers of 100, 150, and 200 mm diameters with advanced sensitivity, capable of inspecting substrates of different materials and thicknesses. Includes options for extra warranty (mandatory), transformer, and training (optional).
Location
Duration
Category
Award Criteria
Deadline
Award details
Le prix n'est pas le seul critère prévu pour cette consultation. L'ensemble des critères figure dans le règlement de la consultation.
Value note
Show original TED data
Original lot title
Fourniture d’un système d’inspection optique compatible en 100, 150 et 200mm
Original TED description
Pour ses activités de recherche et le développement de ses partenariats, CEA LETI souhaite acquérir un système d’inspection optique dédié aux wafers non structurés, capable d’inspecter des diamètres de 100 mm, 150 mm et 200 avec une sensibilité avancée. Le système sélectionné devra être en mesure d’inspecter des substrats de différents matériaux et épaisseurs. Le marché comporte une option avec chiffrage obligatoire : - Option n°1 : Une année de garantie supplémentaire, portant la garantie totale à deux ans Le marché comporte des options avec chiffrage facultatif : - Option n°2 : fourniture d’un transformateur électrique (article 4.1.4 du cahier des charges) - Option n°3 : formation à la maintenance de premier niveau pour le système d’inspection, - Option n°4 : formation à la maintenance avancée pour le système d’inspection,
Procurement Details
- Publication date
- 28 Jun 2026
- Languages
- French
Reference metadata
- Legal basis
- 32014L0024
Reference IDs
- Tender ID
- 442951-2026
Documents (1)
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Opportunity Score
Why this score?
Opportunity
40 / 100
Complexity
50 / 100
Risk factors
No estimated value is provided; may affect go/no-go decision and resource allocation.
Procurement documents (technical specifications, full award criteria) were not analyzed; they may contain critical requ...
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications