FIB & SEM system (HHI-01) - PR1216644-3220-P
Oryginalny tytuł ogłoszenia
Germany – Miscellaneous general and special-purpose machinery – FIB & SEM system (HHI-01) - PR1216644-3220-P
Ocena szansy
Skąd ta ocena?
Szansa
50 / 100
Złożoność
65 / 100
Czynniki ryzyka
No estimated value provided, making it impossible to assess budget fit or competitiveness.
Deadline is less than 30 days from notice publication, which may be insufficient for preparing a detailed technical pro...
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Przegląd
Moderate opportunityKluczowe fakty
- Supplies contract
- 1 lot
- Duration 12 MONTH
- Supply and installation of one field-free FIB-SEM dual-beam system
- Room measurements including floor vibrations, acoustics interference, and magnetic field interference
Pokaż pełne podsumowanie
This tender by Fraunhofer-Gesellschaft is for the procurement, installation, and room measurement of a field-free FIB-SEM dual-beam system for semiconductor research in Berlin. It is a negotiated procedure without call for competition, EU-funded, and SME-suitable. The estimated value is not provided. The deadline for submission is 2026-07-24. Key requirements include delivery of one system, installation, and room measurements (vibrations, acoustics, magnetic interference). Options include advanced training, gas injection system, and KLAF file import software. Eligibility requires three reference projects in semiconductor research using plasma FIB systems, company profile, self-declarations, and turnover evidence. Award criteria are technical quality (50%), sustainability (10%), and price (40%). Documents are available online.
Ryzyka
No estimated value provided, making it impossible to assess budget fit or competitiveness.
Deadline is less than 30 days from notice publication, which may be insufficient for preparing a detailed technical pro...
Kluczowe wymagania
Technical
- Delivery of a field-free FIB-SEM system with high-resolution SEM
- Installation including preparatory measures to meet specifications
- Programmable and automated routines where possible
Kryteria udzielenia
Lot 1
Zamawiający
Lokalizacja
München, DEU
Strona
Profil zamawiającego
Identyfikator
DE 129515865
Działalność
General public services
Części (1)
LOT-0000
FIB & SEM system (HHI-01) - PR1216644-3220-P
Supply, installation, and room measurements of one FIB-SEM dual-beam system for patterning and analysis of III/V semiconductors and related materials. Includes options for training, gas injection system, and software module.
Lokalizacja
Czas trwania
Kategoria
Kryteria udzielenia
Termin
Szczegóły kryteriów
Technik
Nachhaltigkeit
Preis
Dodatkowe kody CPV
Uwaga do wartości
Pokaż oryginalne dane TED
Oryginalny opis TED
1 FIB-SEM dual-beam system As part of the procurement process, a field-free (without immersion optics) focused ion beam system (FIB-SEM) combined with a high-resolution scanning electron microscope (SEM) is to be selected. The system will be used for patterning, nanostructuring, and cross-sectional and surface analysis of primarily III/V semiconductors, LNOI, polymers and resists, as well as process products typical of semiconductor technology. Programmable and automated routines should be configurable where possible. Options - Advanced training course for 15 days (2 people); availability to be confirmed as required - 1 gas injection system with additional components; to be specified in the tender - Software module for importing KLAF files
Szczegóły zamówienia
- Data publikacji
- 28 Jun 2026
- Języki
- German
Metadane referencyjne
- Podstawa prawna
- 32014L0024
Identyfikatory referencyjne
- ID przetargu
- 443173-2026
Dokumenty (2)
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Ocena szansy
Skąd ta ocena?
Szansa
50 / 100
Złożoność
65 / 100
Czynniki ryzyka
No estimated value provided, making it impossible to assess budget fit or competitiveness.
Deadline is less than 30 days from notice publication, which may be insufficient for preparing a detailed technical pro...
Głęboka analiza portfolio
Wykorzystuje:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications