Focused Ion Beam Scanning Electron Microscope
Titre original de l'avis
Sweden – Scanning electron microscopes – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Score d'opportunité
Pourquoi ce score ?
Opportunité
68 / 100
Complexité
42 / 100
Facteurs de risque
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
Analyse approfondie du portefeuille
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- Description
- Industries & Services
- Capabilities
- Market & Experience
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Aperçu
Strong opportunityFaits clés
- SEK 28M estimated value
- Supplies contract
- 1 lot
- Duration until Mar 2028
- Supply of a Focused Ion Beam, Scanning Electron Microscope (FIB-SEM).
- Instrument to be used for high-resolution imaging, materials analysis, TEM sample preparation, and experiments at MAX IV.
Afficher le résumé complet
Open supply tender by Lunds universitet for one FIB-SEM instrument (Focused Ion Beam, Scanning Electron Microscope) for Lund Nano Lab. The contract value is SEK 28,000,000 and electronic submission is required. The notice and XML are consistent on scope, procedure, and deadline; no extracted procurement document text beyond the XML notice was provided, so detailed technical requirements are not analyzed here.
Risques
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
L'analyse peut être incomplète
Seule une partie des documents de consultation a été analysée. Des exigences, certificats ou documents de soumission supplémentaires peuvent exister dans les documents restants.
Exigences clés
Technical
- Contract nature is supplies.
Administrative
- Electronic submission is required.
- Tender language is English.
Critères d'attribution
Lot 1
Acheteur
Localisation
Lund, SWE
Site web
Profil acheteur
Identifiant
202100-3211
Activité
Education
Lots (1)
LOT-0001
Focused Ion Beam Scanning Electron Microscope
Supply of one Focused Ion Beam, Scanning Electron Microscope (FIB-SEM) for Lund Nano Lab at Lund University, intended for high-resolution imaging, materials analysis, TEM sample preparation, and experiments at MAX IV. Place of performance is Sweden, region SE224 (Lund area).
EUR 2.5M
Valeur estimée
Localisation
Durée
Catégorie
Critères d'attribution
Date limite
Détails des critères
Price
Codes CPV supplémentaires
Note sur la valeur
Afficher les données TED originales
Titre original du lot
Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Description TED originale
.
Détails de la procédure
- Date de publication
- 01 Jul 2026
- Langues
- English
Métadonnées de référence
- Base juridique
- 32014L0024
Identifiants de référence
- ID de l'appel d'offres
- 456632-2026
Documents (1)
Appels d'offres similaires
Score d'opportunité
Pourquoi ce score ?
Opportunité
68 / 100
Complexité
42 / 100
Facteurs de risque
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
Analyse approfondie du portefeuille
Utilise:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications