Tenderwize
Retour à la recherche

Rasterelektronenmikroskop

Technische Hochschule Ostwestfalen-Lippe·Lemgo, Germany·Expired · Jul 06, 2026·Open·Supplies
Inscrivez-vous pour sauvegarderOpen documents
Titre original de l'avis

Germany – Laboratory, optical and precision equipments (excl. glasses) – Rasterelektronenmikroskop

70/100

Score d'opportunité

PromisingMedium complexity
SuppliesExpired
Pourquoi ce score ?

Opportunité

70 / 100

Complexité

65 / 100

Facteurs de risque

Highly specific technical requirements (e.g., EDX from same manufacturer as REM, particular stage dimensions, software...

Offers submitted by post, fax, email, or portal communication area will be excluded. Only through the e-Vergabe NRW bid...

Analyse approfondie du portefeuille

Analyse approfondie de l'adéquation entreprise

Utilise:

  • Description
  • Industries & Services
  • Capabilities
  • Market & Experience
  • Certifications

Aperçu

Strong opportunity

Faits clés

  • Supplies contract
  • 1 lot
  • Duration until Feb 2027
  • Supply of a scanning electron microscope (REM) with W cathode (LaB6 upgradeable)
  • EDX analysis system with resolution ≤130eV and active area ≥30mm²
Afficher le résumé complet

Open tender by Technische Hochschule Ostwestfalen-Lippe for the supply, installation, and commissioning of an analytical scanning electron microscope (REM) with EDX system, including software, peripherals, and training. The tender is a single lot (Rasterelektronenmikroskop) with delivery to Lemgo, Germany. The award is based on the best price-quality ratio (price 40%, quality 60%). No estimated value is provided. Deadline for submission: 13 July 2026 at 09:00 UTC (11:00 local time). Electronic submission via e-Vergabe NRW is mandatory. The notice has been corrected to fix weighting percentages.

Risques

Highly specific technical requirements (e.g., EDX from same manufacturer as REM, particular stage dimensions, software...

Offers submitted by post, fax, email, or portal communication area will be excluded. Only through the e-Vergabe NRW bid...

L'analyse peut être incomplète

Seule une partie des documents de consultation a été analysée. Des exigences, certificats ou documents de soumission supplémentaires peuvent exister dans les documents restants.

Exigences clés

Technical

  • Must meet detailed technical specifications (chamber size, stage, detectors, EDX, etc.)
  • Warranty: minimum 12 months; service response time ≤5 working days; spare parts availability ≥5 years
  • Delivery free to installation site (Lemgo, Germany) between October 2026 and February 2027

Critères d'attribution

Lot 1

Preis — 40%Benutzerfreundlichkeit & Software — 9.996%Benutzerfreundlichkeit & SoftwareTechnische Leistungsfähigkeit — 40.002%Technische LeistungsfähigkeitService & Garantie — 9.996%Service & Garantie

Acheteur

Localisation

Lemgo, DEU

Identifiant

057660044044-06001-21

Activité

Education

Lots (1)

LOT-0001

Rasterelektronenmikroskop

Supply, installation, and commissioning of an analytical scanning electron microscope (REM) including EDX analysis system, software, peripherals, and training. Technical specifications detailed: W cathode, LaB6 upgradeable, 200mm chamber, 5-axis motorized stage, high/low vacuum, SE and BSE detectors, EDX with 130eV resolution, Windows 11, etc. Delivery period October 2026 to February 2027.

SuppliesEU fundedElectronic submissionSME suitable

Localisation

Lemgo, Germany

Durée

Sep 2026 - Feb 2027

Catégorie

Laboratory, optical and precision equipments

Critères d'attribution

Preis; Benutzerfreundlichkeit & Software; Benutzerfreundlichkeit & Software; Technische Leistungsfähigkeit; Technische Leistungsfähigkeit; Service & Garantie; Service & Garantie

Date limite

Expired Jul 13, 2026

Détails de la procédure

Date de publication
11 Jun 2026
Langues
German

Métadonnées de référence

Base juridique
32014L0024

Identifiants de référence

ID de l'appel d'offres
403967-2026

Documents (2)

Document de consultation 1Portail de soumission 1

Appels d'offres similaires

Sweden – Scanning electron microscopes – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)

Aug 24

France – Scanning electron microscopes – Microscope électronique à balayage équipé d’un spectromètre EDS et d’accessoires spécifiques

Aug 26

Switzerland – Scanning electron microscopes – MEBMHN_A1 / Acquisition d'un microscope électronique à balayage

Sep 7