FIB & SEM system (HHI-01) - PR1216644-3220-P
Original notice title
Germany – Miscellaneous general and special-purpose machinery – FIB & SEM system (HHI-01) - PR1216644-3220-P
Opportunity Score
Why this score?
Opportunity
50 / 100
Complexity
65 / 100
Risk factors
No estimated value provided, making it impossible to assess budget fit or competitiveness.
Deadline is less than 30 days from notice publication, which may be insufficient for preparing a detailed technical pro...
Deep Portfolio Analysis
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- Description
- Industries & Services
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- Market & Experience
- Certifications
Overview
Moderate opportunityKey Facts
- Supplies contract
- 1 lot
- Duration 12 MONTH
- Supply and installation of one field-free FIB-SEM dual-beam system
- Room measurements including floor vibrations, acoustics interference, and magnetic field interference
Show full summary
This tender by Fraunhofer-Gesellschaft is for the procurement, installation, and room measurement of a field-free FIB-SEM dual-beam system for semiconductor research in Berlin. It is a negotiated procedure without call for competition, EU-funded, and SME-suitable. The estimated value is not provided. The deadline for submission is 2026-07-24. Key requirements include delivery of one system, installation, and room measurements (vibrations, acoustics, magnetic interference). Options include advanced training, gas injection system, and KLAF file import software. Eligibility requires three reference projects in semiconductor research using plasma FIB systems, company profile, self-declarations, and turnover evidence. Award criteria are technical quality (50%), sustainability (10%), and price (40%). Documents are available online.
Risks
No estimated value provided, making it impossible to assess budget fit or competitiveness.
Deadline is less than 30 days from notice publication, which may be insufficient for preparing a detailed technical pro...
Key Requirements
Technical
- Delivery of a field-free FIB-SEM system with high-resolution SEM
- Installation including preparatory measures to meet specifications
- Programmable and automated routines where possible
Award Criteria
Lot 1
Buyer
Location
München, DEU
Website
Buyer profile
Identifier
DE 129515865
Activity
General public services
Lots (1)
LOT-0000
FIB & SEM system (HHI-01) - PR1216644-3220-P
Supply, installation, and room measurements of one FIB-SEM dual-beam system for patterning and analysis of III/V semiconductors and related materials. Includes options for training, gas injection system, and software module.
Location
Duration
Category
Award Criteria
Deadline
Award details
Technik
Nachhaltigkeit
Preis
Additional CPV codes
Value note
Show original TED data
Original TED description
1 FIB-SEM dual-beam system As part of the procurement process, a field-free (without immersion optics) focused ion beam system (FIB-SEM) combined with a high-resolution scanning electron microscope (SEM) is to be selected. The system will be used for patterning, nanostructuring, and cross-sectional and surface analysis of primarily III/V semiconductors, LNOI, polymers and resists, as well as process products typical of semiconductor technology. Programmable and automated routines should be configurable where possible. Options - Advanced training course for 15 days (2 people); availability to be confirmed as required - 1 gas injection system with additional components; to be specified in the tender - Software module for importing KLAF files
Procurement Details
- Publication date
- 28 Jun 2026
- Languages
- German
Reference metadata
- Legal basis
- 32014L0024
Reference IDs
- Tender ID
- 443173-2026
Documents (2)
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Opportunity Score
Why this score?
Opportunity
50 / 100
Complexity
65 / 100
Risk factors
No estimated value provided, making it impossible to assess budget fit or competitiveness.
Deadline is less than 30 days from notice publication, which may be insufficient for preparing a detailed technical pro...
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications