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Acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure

Université de Technologie de Compiègne·Compiegne, France·EUR 0·Expired · Jul 10, 2026·Open·Supplies
Structured notice only
Original notice title

France – Scanning electron microscopes – Acquisition d'un microscope électronique à balayage, field emission gun (MEB FEG), à pression variable pour l'université de technologie de Compiègne

50/100

Opportunity Score

Needs reviewMedium complexity
SuppliesExpired
Why this score?

Opportunity

50 / 100

Complexity

60 / 100

Risk factors

No estimated value is given (0 EUR placeholder). Bidders cannot assess if budget is sufficient or anticipate competitio...

Discrepancy between structured data deadline (2026-07-10 10:00) and XML notice (2026-07-10 12:00). May cause late submi...

Deep Portfolio Analysis

Deep Company Fit Analysis

Uses:

  • Description
  • Industries & Services
  • Capabilities
  • Market & Experience
  • Certifications

Overview

Moderate opportunity

Key Facts

  • EUR 0 estimated value
  • Supplies contract
  • 1 lot
  • Duration 10 MONTH
  • Supply of one field emission gun scanning electron microscope (MEB FEG) with variable pressure capability
  • Delivery and installation at Université de Technologie de Compiègne, Compiègne, France
Show full summary

This tender, issued by Université de Technologie de Compiègne (UTC), concerns the acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure capability, for delivery in Compiègne, France. The contract is for supplies, EU-funded, and follows an open procedure. The deadline for submission is 2026-07-10, with a time discrepancy (10:00 UTC vs 12:00 CET) that needs clarification. The estimated value is reported as 0 EUR, likely a placeholder. Award criteria are 70% technical quality (with sub-criteria), 20% price, and 10% after-sales service quality. Selection criteria are not specified. Procurement documents are available online but were not analyzed.

Risks

No estimated value is given (0 EUR placeholder). Bidders cannot assess if budget is sufficient or anticipate competitio...

Discrepancy between structured data deadline (2026-07-10 10:00) and XML notice (2026-07-10 12:00). May cause late submi...

Analysis may be incomplete

Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.

Key Requirements

Technical

  • EU funding requires compliance with EU procurement rules

Administrative

  • Open procedure: any interested party may submit a tender
  • Electronic submission via achatpublic.com is required

Requirements may be incomplete.

Award Criteria

Lot 1

Technical value 70% (sample analysis, features, software)70%Price 20%20%After-sales service 10% (warranty, support, spare parts)10%

Buyer

Location

Compiegne, FRA

Buyer profile

Open profile

Identifier

19601223100169

Activity

Education

Lots (1)

LOT-0001

Acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure

Supply and delivery of one MEB FEG microscope, including associated software, warranty, and after-sales support. Duration 10 months. EU-funded.

SuppliesEU fundedElectronic submission

EUR 0

Estimated value

Location

Compiègne, France

Duration

10 MONTH

Category

Scanning electron microscopes

Award Criteria

Price

Deadline

Expired Jul 10, 2026

Procurement Details

Publication date
09 Jun 2026
Languages
French

Reference metadata

Legal basis
32014L0024

Reference IDs

Tender ID
397687-2026

Documents (2)

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