Focused Ion Beam Scanning Electron Microscope
Originaltitel der Bekanntmachung
Sweden – Scanning electron microscopes – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Opportunity Score
Warum diese Bewertung?
Chance
68 / 100
Komplexität
42 / 100
Risikofaktoren
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
Tiefe Portfolioanalyse
Verwendet:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications
Überblick
Strong opportunityWichtige Fakten
- SEK 28M estimated value
- Supplies contract
- 1 lot
- Duration until Mar 2028
- Supply of a Focused Ion Beam, Scanning Electron Microscope (FIB-SEM).
- Instrument to be used for high-resolution imaging, materials analysis, TEM sample preparation, and experiments at MAX IV.
Vollständige Zusammenfassung anzeigen
Open supply tender by Lunds universitet for one FIB-SEM instrument (Focused Ion Beam, Scanning Electron Microscope) for Lund Nano Lab. The contract value is SEK 28,000,000 and electronic submission is required. The notice and XML are consistent on scope, procedure, and deadline; no extracted procurement document text beyond the XML notice was provided, so detailed technical requirements are not analyzed here.
Risiken
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
Analyse kann unvollständig sein
Nur ein Teil der Vergabeunterlagen wurde analysiert. Weitere Anforderungen, Zertifikate oder Einreichungsdokumente können in den übrigen Unterlagen enthalten sein.
Wichtige Anforderungen
Technical
- Contract nature is supplies.
Administrative
- Electronic submission is required.
- Tender language is English.
Zuschlagskriterien
Lot 1
Auftraggeber
Ort
Lund, SWE
Website
Auftraggeberprofil
Kennung
202100-3211
Tätigkeit
Education
Lose (1)
LOT-0001
Focused Ion Beam Scanning Electron Microscope
Supply of one Focused Ion Beam, Scanning Electron Microscope (FIB-SEM) for Lund Nano Lab at Lund University, intended for high-resolution imaging, materials analysis, TEM sample preparation, and experiments at MAX IV. Place of performance is Sweden, region SE224 (Lund area).
EUR 2.5M
Geschätzter Wert
Ort
Dauer
Kategorie
Zuschlagskriterien
Frist
Zuschlagsdetails
Price
Zusätzliche CPV-Codes
Hinweis zum Wert
Originale TED-Daten anzeigen
Originaler Los-Titel
Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Originale TED-Beschreibung
.
Vergabedetails
- Veröffentlichungsdatum
- 01 Jul 2026
- Sprachen
- English
Referenzmetadaten
- Rechtsgrundlage
- 32014L0024
Referenz-IDs
- Ausschreibungs-ID
- 456632-2026
Dokumente (1)
Ähnliche Ausschreibungen
Opportunity Score
Warum diese Bewertung?
Chance
68 / 100
Komplexität
42 / 100
Risikofaktoren
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
Tiefe Portfolioanalyse
Verwendet:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications