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Supply of optical metrology equipment 100/150/200mm

CEA/GRENOBLE·Grenoble, France·EUR 1·Deadline Aug 06, 2026 · 6 days left·Neg W Call·Supplies
Structured notice only
Originaltitel der Bekanntmachung

France – Electronic, electromechanical and electrotechnical supplies – Fourniture d’un équipement de métrologie optique 100/150/200mm

50/100

Opportunity Score

Needs reviewMedium complexity
SuppliesOpen
Warum diese Bewertung?

Chance

50 / 100

Komplexität

50 / 100

Risikofaktoren

No real estimated value given; bidders cannot gauge project size or expected budget.

Full award criteria not disclosed in notice; may include quality, technical, or after-sales criteria that could outweig...

Submission deadline in 6 days

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Überblick

Moderate opportunity

Wichtige Fakten

  • EUR 1 estimated value
  • Supplies contract
  • 1 lot
  • Duration 12 MONTH
  • Supply of an optical metrology system for inspection of unstructured wafers (100mm, 150mm, 200mm)
  • System must inspect thin and thick substrates, detect defects, and capture microscope images
Vollständige Zusammenfassung anzeigen

This tender by CEA/GRENOBLE involves the procurement of an optical metrology system for inspecting unstructured wafers of 100mm, 150mm, and 200mm. The system must handle thin and thick substrates, detect defects, and capture images. The contract includes base equipment, mandatory extended warranty (OPT1), and optional items (heat exchangers, transformer, training). The estimated value is indicated as 1 EUR, likely a placeholder; no actual budget is disclosed. The procedure is a negotiated procedure with call for competition (neg-w-call). Submission is electronic via the French procurement platform. Award criteria include price and other criteria not specified in the notice. The contract is EU-funded (FEDER). Only one lot identified.

Risiken

No real estimated value given; bidders cannot gauge project size or expected budget.

Full award criteria not disclosed in notice; may include quality, technical, or after-sales criteria that could outweig...

Submission deadline in 6 days

Analyse kann unvollständig sein

Nur ein Teil der Vergabeunterlagen wurde analysiert. Weitere Anforderungen, Zertifikate oder Einreichungsdokumente können in den übrigen Unterlagen enthalten sein.

Wichtige Anforderungen

Technical

  • Capable of inspecting wafers of 100mm, 150mm, 200mm (bridge tool)
  • Handle both thin and thick substrates
  • Ability to inspect exotic substrates

Anforderungen können unvollständig sein.

Zuschlagskriterien

Lot 1

Price is an award criterion, but full criteria are only in procurement documents.

Auftraggeber

Ort

Grenoble, FRA

Website

www.cea.fr

Auftraggeberprofil

Profil öffnen

Kennung

775 685 019 00298

Tätigkeit

Education

Lose (1)

LOT-0001

Supply of optical metrology equipment 100/150/200mm

One lot for the supply, installation, and commissioning of an optical inspection system for wafers. Includes base equipment, mandatory 1-year warranty extension, and optional items. Delivery DAP CEA Grenoble. Duration 12 months.

SuppliesEU fundedElectronic submission

EUR 1

Geschätzter Wert

Ort

Grenoble, France

Dauer

12 MONTH

Kategorie

Microelectronic machinery and apparatus

Zuschlagskriterien

Price

Frist

Deadline Aug 06, 2026

Vergabedetails

Veröffentlichungsdatum
30 Jun 2026
Sprachen
French

Referenzmetadaten

Rechtsgrundlage
32014L0024

Referenz-IDs

Ausschreibungs-ID
449595-2026

Dokumente (1)

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