Supply of an optical inspection system compatible with 100, 150 and 200mm

CEA Grenoble·Grenoble, France·Expired · Jul 27, 2026·Neg W Call·Supplies

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Structured notice only

Originaltitel der Bekanntmachung

France – Microelectronic machinery and apparatus – Fourniture d’un système d’inspection optique compatible en 100, 150 et 200mm

40/100

Opportunity Score

Needs reviewMedium complexity

SuppliesExpired

Warum diese Bewertung?

Chance

40 / 100

Komplexität

50 / 100

Risikofaktoren

No estimated value is provided; may affect go/no-go decision and resource allocation.

Procurement documents (technical specifications, full award criteria) were not analyzed; they may contain critical requ...

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Market & Experience
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Eckdaten der Ausschreibung

Öffentlicher Auftraggeber: CEA Grenoble
Land: Frankreich
CPV: 31712100 - Microelectronic machinery and apparatus
Frist: Jul 27, 2026

Überblick

Moderate opportunity

Wichtige Fakten

Supplies contract
1 lot
Duration 12 MONTH
Supply and delivery of an optical inspection system for unstructured wafers (100, 150, 200 mm diameters) with advanced sensitivity.
Inspection of substrates of various materials and thicknesses.

Vollständige Zusammenfassung anzeigen

This tender from CEA LETI (France) seeks an optical inspection system for unstructured wafers of 100, 150, and 200 mm diameters, with advanced sensitivity, for research activities. The contract includes a compulsory option for an extra warranty year and optional options for a transformer and maintenance training. The procedure is negotiated with a call for competition, and the contract is EU-funded (FEDER). No estimated value is provided. The submission deadline is 2026-07-27 (with a minor inconsistency between structured data and XML notice). The tender documents are available online but were not analyzed in detail.

Risiken

No estimated value is provided; may affect go/no-go decision and resource allocation.

Procurement documents (technical specifications, full award criteria) were not analyzed; they may contain critical requ...

Analyse kann unvollständig sein

Nur ein Teil der Vergabeunterlagen wurde analysiert. Weitere Anforderungen, Zertifikate oder Einreichungsdokumente können in den übrigen Unterlagen enthalten sein.

Wichtige Anforderungen

Technical

System must be compatible with 100 mm, 150 mm, and 200 mm wafer diameters.
Advanced sensitivity required for unstructured wafers.
Ability to inspect substrates of different materials and thicknesses.

Anforderungen können unvollständig sein.

Zuschlagskriterien

Lot 1

Price is a criterion but not the only one; full criteria are in the consultation regulations.

Auftraggeber

Name

CEA Grenoble

Ort

Grenoble, FRA

E-Mail

[email protected]

Website

www.cea.fr

Auftraggeberprofil

Profil öffnen

Kennung

775 685 019 00298

Tätigkeit

Education

Lose (1)

LOT-0001