Germany – Instruments for measuring electrical quantities – 300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

IHP GmbH - Leibniz-Institut für innovative MikroelektronikFrankfurt (Oder), GermanyNot disclosed27 days leftopen

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Opportunity Score

Confidence: 40%

Complexity: high

27 days

Deadline

supplies

Contract

SME suitable

Deep Portfolio Analysis

Company fit score
Missing certificates
Eligibility blockers
Bid / No-Bid recommendation

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AI Analysis Summary

Moderate opportunity

Supply of a 300 mm semi-automatic RF probe system for on-wafer measurements up to 250 GHz, including controlled dry atmosphere and precision stages. The tender is for a single lot, open procedure, with electronic submission required and German as the only submission language.

Strengths

Documents available

Open procedure

27 days left

Analysis may be incomplete

Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.

Key Requirements

System must support wafer sizes 150 mm, 200 mm, 300 mm, and single chips up to 5×5 mm
Automatic wafer size detection required
Defined interface architecture for optional thermal chuck integration (mechanical, electrical, software)

Buyer

Name

IHP GmbH - Leibniz-Institut für innovative Mikroelektronik

Location

Frankfurt (Oder), DEU

[email protected]

Identifier

DE138996546

Lots (1)

#LOT-0001300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

Halbautomatisches 300-mm-HF-Messsystem mit kontrollierter Trockenatmosphäre für On-Wafer-Messungen bis 250 GHz, inklusive Präzisions-XY- und Z-Tische, Theta-Achse, Schwingungsisolierung und zentraler Bedienkonsole.

38341300, 38540000DEU