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Acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure

Université de Technologie de Compiègne·Compiegne, France·EUR 0·Expired · Jul 10, 2026·Open·Supplies
Structured notice only
Originaltitel der Bekanntmachung

France – Scanning electron microscopes – Acquisition d'un microscope électronique à balayage, field emission gun (MEB FEG), à pression variable pour l'université de technologie de Compiègne

50/100

Opportunity Score

Needs reviewMedium complexity
SuppliesExpired
Warum diese Bewertung?

Chance

50 / 100

Komplexität

60 / 100

Risikofaktoren

No estimated value is given (0 EUR placeholder). Bidders cannot assess if budget is sufficient or anticipate competitio...

Discrepancy between structured data deadline (2026-07-10 10:00) and XML notice (2026-07-10 12:00). May cause late submi...

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Überblick

Moderate opportunity

Wichtige Fakten

  • EUR 0 estimated value
  • Supplies contract
  • 1 lot
  • Duration 10 MONTH
  • Supply of one field emission gun scanning electron microscope (MEB FEG) with variable pressure capability
  • Delivery and installation at Université de Technologie de Compiègne, Compiègne, France
Vollständige Zusammenfassung anzeigen

This tender, issued by Université de Technologie de Compiègne (UTC), concerns the acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure capability, for delivery in Compiègne, France. The contract is for supplies, EU-funded, and follows an open procedure. The deadline for submission is 2026-07-10, with a time discrepancy (10:00 UTC vs 12:00 CET) that needs clarification. The estimated value is reported as 0 EUR, likely a placeholder. Award criteria are 70% technical quality (with sub-criteria), 20% price, and 10% after-sales service quality. Selection criteria are not specified. Procurement documents are available online but were not analyzed.

Risiken

No estimated value is given (0 EUR placeholder). Bidders cannot assess if budget is sufficient or anticipate competitio...

Discrepancy between structured data deadline (2026-07-10 10:00) and XML notice (2026-07-10 12:00). May cause late submi...

Analyse kann unvollständig sein

Nur ein Teil der Vergabeunterlagen wurde analysiert. Weitere Anforderungen, Zertifikate oder Einreichungsdokumente können in den übrigen Unterlagen enthalten sein.

Wichtige Anforderungen

Technical

  • EU funding requires compliance with EU procurement rules

Administrative

  • Open procedure: any interested party may submit a tender
  • Electronic submission via achatpublic.com is required

Anforderungen können unvollständig sein.

Zuschlagskriterien

Lot 1

Technical value 70% (sample analysis, features, software)70%Price 20%20%After-sales service 10% (warranty, support, spare parts)10%

Auftraggeber

Ort

Compiegne, FRA

Auftraggeberprofil

Profil öffnen

Kennung

19601223100169

Tätigkeit

Education

Lose (1)

LOT-0001

Acquisition of a field emission gun scanning electron microscope (MEB FEG) with variable pressure

Supply and delivery of one MEB FEG microscope, including associated software, warranty, and after-sales support. Duration 10 months. EU-funded.

SuppliesEU fundedElectronic submission

EUR 0

Geschätzter Wert

Ort

Compiègne, France

Dauer

10 MONTH

Kategorie

Scanning electron microscopes

Zuschlagskriterien

Price

Frist

Expired Jul 10, 2026

Vergabedetails

Veröffentlichungsdatum
09 Jun 2026
Sprachen
French

Referenzmetadaten

Rechtsgrundlage
32014L0024

Referenz-IDs

Ausschreibungs-ID
397687-2026

Dokumente (2)